Report: There is a crack in everything. That’s how the light gets in: 3rd European TA Conference, Cork, Ireland, May 17–19, 201

Carmen Priefer; Linda Nierling; Constanze Scherz; Mahshid Sotoudeh; Lenka Hebáková

doi:10.14512/tatup.26.3.76

Report: There is a crack in everything. That’s how the light gets in

3rd European TA Conference, Cork, Ireland, May 17–19, 201

Authors

Carmen Priefer Institute for Technology Assessment and Systems Analysis (ITAS), Karlsruhe Institute of Technology (KIT), (DE) carmen.priefer@kit.edu
Linda Nierling Institute for Technology Assessment and Systems Analysis (ITAS), Karlsruhe Institute of Technology (KIT) (DE) linda.nierling@kit.edu
Constanze Scherz Institute for Technology Assessment and Systems Analysis (ITAS), Karlsruhe Institute of Technology (KIT) (DE) constanze.scherz@kit.edu
Mahshid Sotoudeh Institute for Technology Assessment (ITA), Austrian Academy of Sciences (AT) msotoud@oeaw.ac.at
Lenka Hebáková Technology Centre of the CAS (TC) (CZ) hebakova@tc.cz

DOI:

https://doi.org/10.14512/tatup.26.3.76

Abstract

Meeting Report on the 3rd European TA Conference in Cork, Ireland on May 17th – 19th 2017.

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Published

20.12.2018

How to Cite

Priefer C, Nierling L, Scherz C, Sotoudeh M, Hebáková L. Report: There is a crack in everything. That’s how the light gets in: 3rd European TA Conference, Cork, Ireland, May 17–19, 201. TATuP [Internet]. 2018 Dec. 20 [cited 2024 Oct. 16];26(3):76-8. Available from: https://www.tatup.de/index.php/tatup/article/view/74